Metrology & Instrumentation
AFM /SPM - Systems
Caliber SPM
The NEW low-cost, high value Caliber scanning probe microscope (SPM) is the ideal entry level instrument for surface science research.
Dimension 3100
Accepts samples up to 200mm for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, and optics.
Dimension V Scanning Probe Microscope (SPM)
Incorporating high-performance Nanoscope V controller for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200mm.
EnviroScope
AFM with a sealed hermetic sample chamber for control of sample atmosphere and temperature.
Innova SPM
The Innova scanning probe microscope (SPM) delivers high-resolution scanning and a wide range of functionality for physical, materials,. And life sciences, all at a much lower price than comparable systems.
MultiMode
The world's best-selling SPM, providing a full range of atomic force microscopy and scanning tunneling microscopy technique.
MultiMode V
The next generation of the world's best-selling, most field-proven SPM, incorporating the high-speed, high-resolution Nanoscope V controller.
NanoMan VS
The preeminent system for high-resolution imaging, high-definition nanolithography, and direct nanoscale manipulation.
PicoForce
Innovative force-measurement features and handheld PicoAngler force-feedback device allows quantified and tactile interpretations of molecular structure.