Nanoscale VI Conference
About the Conference
Call For Papers
For Attendees
Travel And Points of Interest
Have your voice heard among your peers and experts in nanotechnology!
Welcome to Seeing at the Nanoscale VI, the annual scientific conference focusing on nanostructural imaging, characterization, and modification using scanning probe microscopy (SPM) and related techniques.
The conference location is in the center of Berlin, Germany, July 9-11, 2008. Sponsored by Veeco Instruments and supported by Humboldt University Berlin, Department of Physics, this event includes technical presentations, a nanotechnology poster contest, and a gala dinner to get special flaviour from Berlin.
The conference location is in the center of Berlin, Germany, July 9-11, 2008. Sponsored by Veeco Instruments and supported by Humboldt University Berlin, Department of Physics, this event includes technical presentations, a nanotechnology poster contest, and a gala dinner to get special flaviour from Berlin.
Highlighted by the conference chairman Prof. Dr. Jürgen P. Rabe Seeing at the Nanoscale VI provides an optimum forum for "scientists to speak to scientists" on a wide variety of nanotechnology topics with four technical sessions on:
Session I
Extending the limits of SPM: high speed scanning, ultra high resolution imaging, multiple probe SPM, novel probes
Chair
Georg Schitter TU Delft, Delft, The Netherlands
Keynote
Toshio Ando Kanazawa University, Kanazawa, Japan
Invited
Oscar Custance National Institute for Materials Science (NIMS), Tsukuba, Japan
Chanmin Su Veeco Instruments, Santa Barbara, USA
Nataliya Dorozhovets TU Ilmenau, Germany
Jose R. Lozano CSIC, Tres cantos, Madrid, Spain
Nicholas Mullin University of Sheffield, Sheffield, United Kingdom
Claudia Baier Technische Universität München (TUM), Garching, GermanySession II
From single biomolecules to cells: using AFM and combined AFM-optical
Chair
Hans Oberleithner Universitat Muenster, Muenster, Germany
Keynote
Daniel Müller BIOTEC, Dresden, Germany
Invited
Clive Roberts School of Pharmacy, University of Nottingham, United Kingdom
Hua Liang Humboldt University Berlin, Germany
Tomoji Kawai Osaka University, Osaka, Japan
Thomas Schmid ETH Zürich, Zürich, Switzerland
Annalisa Relini University of Genoa, Italy
Nikolay Buzhynskyy Institut Curie, Paris, FranceSession III
Next generation materials and polymer systems
Chair
G.J. Vancso Universiteit Twente, Enschede, The Netherlands
Keynote
Jiro Kumaki Yamagata University, Yamagata, Japan
Invited
Christian Fretigny CNRS, Paris, France
Christiane Norenberg University of Oxford, United Kingdom
Andrey Klymchenko Université Louis Pasteur, Strasbourg, France
Clemens Liedel Universität Bayreuth, Germany
Robert Magerle Technische Universtität Chemnitz, Germany
Jacob Sagiv Weizmann Institute, Rehovot, Israel
Session IV
Beyond topography: measurement of physical properties at the Nanoscale
-nanomechanical, electrical, optical, magnetic and thermal
-nanomechanical, electrical, optical, magnetic and thermal
Chair
Robert W. Stark Ludwig-Maximilians-Universität München, Munich, Germany
Keynote
Wilfried Vandervorst, IMEC, Leuven, Belgium and Dept. Physics, KULeuven, Belgium
Invited
Ozgur Sahin Harvard University, Cambridge, USA
Patrick Fiorenza CNR-IMM, Catania, Italy
Natalia Erina Veeco Instruments, Santa Barbara, USA
Carlos J. Gomez CSIC, Tres Cantos, Madrid, Spain
Tim Albrecht Imperial College London, United Kingdom
Doerthe Melitta Eisele Humboldt University Berlin, Germany
Book the dates in your diary! 9-11 July 2008
